X-RAY FLUORESCENCE

 

X-Ray Fluorescence (XRF) spectrometer is an x-ray non-destructive technique used to measure metallic finishing thickness of PCB and components leads plating. The relative ease and low cost of sample preparation, the stability and the ease of use of x-ray spectrometers make this one of the most widely used methods for materials investigations. This technique is also suitable to research RoHS banned elements.